Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/22/2022
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Application #:
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16800288
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Filing Dt:
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02/25/2020
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Publication #:
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Pub Dt:
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03/04/2021
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Inventors:
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Yuki Watanabe, Masato Nakazato, Shohei Morishima
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Title:
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SEMICONDUCTOR INTEGRATED CIRCUIT WITH SELF TESTING AND METHOD OF TESTING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, SHIBAURA 1-CHOME |
| MINATO-KU, TOKYO, JAPAN 105-0023 |
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| 1-1, SHIBAURA 1-CHOME |
| MINATO-KU, TOKYO, JAPAN 105-0023 |
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| WHITE & CASE LLP |
| 701 13TH STREET NW |
| WASHINGTON, DC 20005 |
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