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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
11295438
Issue Dt:
04/05/2022
Application #:
16206691
Filing Dt:
11/30/2018
Publication #:
20190108630
Pub Dt:
04/11/2019
Inventors:
Jason Z. Lin, Allen Park, Ellis Chang, Richard Wallingford, Songnian Rong et al
Title:
METHOD AND SYSTEM FOR MIXED MODE WAFER INSPECTION
Assignment: 1
Reel/Frame:
047645/0318Recorded: 11/30/2018Pages: 10
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
LIN, JASON Z.
Exec Dt:
02/05/2014
PARK, ALLEN
Exec Dt:
12/13/2013
CHANG, ELLIS
Exec Dt:
12/16/2013
WALLINGFORD, RICHARD
Exec Dt:
01/29/2014
RONG, SONGNIAN
Exec Dt:
01/29/2014
BHASKAR, CHETANA
Exec Dt:
01/29/2014
Assignee:
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY
SUITE 220
OMAHA, NE 68154-5299
Assignment: 2
Reel/Frame:
059253/0326Recorded: 02/28/2022Pages: 3
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
KLA-TENCOR CORPORATION
Exec Dt:
06/19/2019
Assignee:
KLA CORPORATION
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY, SUITE 220
OMAHA, NE 68154

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