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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/12/2022
Application #:
17042290
Filing Dt:
09/28/2020
Publication #:
Pub Dt:
01/14/2021
Inventors:
Takahiro Nishihata, Mayuka Osaki, Takuma Yamamoto, Akira Hamaguchi, Yusuke Iida et al
Title:
ELECTRON MICROSCOPE APPARATUS, INSPECTION SYSTEM USING ELECTRON MICROSCOPE APPARATUS, AND INSPECTION METHOD USING ELECTRON MICROSCOPE APPARATUS
Assignment: 1
Reel/Frame:
054360/0056Recorded: 11/13/2020Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/01/2020
Exec Dt:
10/01/2020
Exec Dt:
10/02/2020
Exec Dt:
10/05/2020
Exec Dt:
10/05/2020
Assignee:
1-17-1 TORANOMON
MINATO-KU, TOKYO, JAPAN 105-6409
Correspondent:
MILES & STOCKBRIDGE, P.C.
1751 PINNACLE DRIVE, SUITE 1500
TYSONS CORNER, VA 22102-3833

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