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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
11340286
Issue Dt:
05/24/2022
Application #:
16625329
Filing Dt:
12/20/2019
Publication #:
20220003811
Pub Dt:
01/06/2022
Inventors:
Aihua WU, Chong LI, Chen LIU, Yibang WANG, Xingchang FU, Faguo LIANG, Xiuwei TIAN, Yanan LIU et al
Title:
NEW ON-WAFER S-PARAMETER CALIBRATION METHOD
Assignment: 1
Reel/Frame:
052255/0506Recorded: 03/30/2020Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
WU, AIHUA
Exec Dt:
12/02/2019
LI, CHONG
Exec Dt:
12/05/2019
LIU, CHEN
Exec Dt:
12/02/2019
WANG, YIBANG
Exec Dt:
12/02/2019
FU, XINGCHANG
Exec Dt:
12/02/2019
LIANG, FAGUO
Exec Dt:
12/02/2019
TIAN, XIUWEI
Exec Dt:
12/02/2019
LIU, YANAN
Exec Dt:
12/02/2019
CAO, JIAN
Exec Dt:
12/02/2019
Assignee:
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
NO. 113 COOPERATION ROAD
XINHUA DISTRICT
SHIJIAZHUANG, HEBEI, CHINA 050051
Correspondent:
SHIJIAZHUANG GOWELL INTELLECTUALPROPERTY LAW FIRM
9FLOOR B BLOCK, HUI GU BUILDING
95 QILIAN STREET, HI-TECH ZONE
SHIJIAZHUANG, HEBEI, 050000 CHINA

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