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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
11435178
Issue Dt:
09/06/2022
Application #:
16638634
Filing Dt:
02/12/2020
Publication #:
20210131801
Pub Dt:
05/06/2021
Inventors:
Yusuke ABE, Yasunari SOHDA, Yoshinori NAKAYAMA, Kaori BIZEN, Hiroya OHTA
Title:
CALIBRATION SAMPLE, ELECTRON BEAM ADJUSTMENT METHOD AND ELECTRON BEAM APPARATUS USING SAME
Assignment: 1
Reel/Frame:
051802/0188Recorded: 02/12/2020Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
SOHDA, YASUNARI
Exec Dt:
12/13/2019
NAKAYAMA, YOSHINORI
Exec Dt:
12/18/2019
BIZEN, KAORI
Exec Dt:
12/24/2019
OHTA, HIROYA
Exec Dt:
12/16/2019
ABE, YUSUKE
Exec Dt:
12/17/2019
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN 105-8717
Correspondent:
ERIC G. KING
MILES & STOCKBRIDGE PC
1751 PINNACLE DRIVE, SUITE 1500
TYSONS CORNER, VA 22102
Assignment: 2
Reel/Frame:
060538/0524Recorded: 07/18/2022Pages: 4
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/14/2020
Assignee:
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME
MINATO-KU, TOKYO, JAPAN 105-6409
Correspondent:
ERIC G. KING
MILES & STOCKBRIDGE, P.C.
1751 PINNACLE DRIVE, SUITE 1500
TYSONS CORNER, VA 22102-3833

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