Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/27/2022
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Application #:
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17043770
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Filing Dt:
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09/30/2020
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Publication #:
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Pub Dt:
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05/06/2021
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Inventors:
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Hidekazu YAMAZAKI, Yukio KUMAMOTO
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Title:
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PROBE, INSPECTION JIG, INSPECTION DEVICE, AND METHOD FOR MANUFACTURING PROBE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 10 TSUTSUMISOTO-CHO, NISHIKYOGOKU, UKYO-KU |
| KYOTO, JAPAN 615-0854 |
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| VIERING, JENTSCHURA & PARTNER MBB |
| C/O 444 BRICKELL AVENUE. |
| SUITE 700 |
| MIAMI, FL 33131 |
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