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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/18/2022
Application #:
16488588
Filing Dt:
08/25/2019
Publication #:
Pub Dt:
08/06/2020
Inventors:
Han Woo LEE, Si Seok LEE, Deokhwe HUR, Hee Kyung PARK
Title:
METHOD FOR ANALYZING MELTING CURVE USING BI- FUNCTIONAL PNA PROBE, METHOD FOR DIAGNOSING MICROSATELLITE INSTABILITY USING THE SAME, AND KIT FOR DIAGNOSING MICROSATELLITE INSTABILITY
Assignment: 1
Reel/Frame:
050251/0810Recorded: 09/02/2019Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/28/2019
Exec Dt:
08/28/2019
Exec Dt:
08/28/2019
Exec Dt:
08/28/2019
Assignee:
N517, 11-3, TECHNO 1-RO, YUSEONG-GU
DAEJEON, KOREA, REPUBLIC OF 34015
Correspondent:
HULTQUIST, PLLC
P.O. BOX 14329
RESEARCH TRIANGLE PK, NC 27709

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