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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
11/15/2022
Application #:
16284169
Filing Dt:
02/25/2019
Publication #:
Pub Dt:
09/26/2019
Inventors:
Masahiro YAMAMOTO, Shigehiko IWAMA, Atsushi SAITO
Title:
Nanoparticle Measurement Device, Analysis Device, and Analysis Method
Assignment: 1
Reel/Frame:
048443/0292Recorded: 02/26/2019Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/27/2018
Exec Dt:
11/27/2018
Exec Dt:
11/27/2018
Assignee:
3-12, MORIYACHO, KANAGAWA-KU,
YOKOHAMA-SHI, KANAGAWA, JAPAN 221-0022
Correspondent:
NATH, GOLDBERG & MEYER
112 S WEST STREET
36401U_JLM_HJ
ALEXANDRIA, VA 22314

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