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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
11/29/2022
Application #:
17086281
Filing Dt:
10/30/2020
Publication #:
Pub Dt:
04/14/2022
Inventors:
John Fretwell, Tomas Vystavel, Roger Alvis, Laurens Kwakman
Title:
METHOD AND SYSTEM FOR WAFER DEFECT INSPECTION
Assignment: 1
Reel/Frame:
054610/0304Recorded: 12/10/2020Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/09/2020
Exec Dt:
11/11/2020
Exec Dt:
11/20/2020
Exec Dt:
11/09/2020
Assignee:
5350 NE DAWSON CREEK DRIVE
HILLSBORO, OREGON 97124-5793
Correspondent:
KLARQUIST SPARKMAN, LLP
121 SW SALMON STREET, SUITE 1600
ONE WORLD TRADE CENTER
PORTLAND, OR 97204

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