Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/17/2023
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Application #:
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16922458
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Filing Dt:
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07/07/2020
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Publication #:
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Pub Dt:
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01/13/2022
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Inventors:
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Tsuneo Abe, Vikrant Upadhyaya
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Title:
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TESTING PROBE SYSTEM FOR TESTING SEMICONDUCTOR DIE, MULTI-CHANNEL DIE HAVING SHARED PADS, AND RELATED SYSTEMS AND METHODS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 8000 SOUTH FEDERAL WAY |
| MAILSTOP 1-507 |
| BOISE, IDAHO 83707-0006 |
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| TRASK BRITT, P.C./ MICRON TECHNOLOGY |
| P.O. BOX 2550 |
| SALT LAKE CITY, UT 84110 |
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