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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/07/2023
Application #:
17338449
Filing Dt:
06/03/2021
Publication #:
Pub Dt:
09/23/2021
Inventors:
Houssam Chouaib, Aaron Rosenberg, Kai-Hsiang Lin, Zhengquan Tan, Dawei Hu
Title:
Scatterometry Based Methods And Systems For Measurement Of Strain In Semiconductor Structures
Assignment: 1
Reel/Frame:
061747/0151Recorded: 11/13/2022Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/25/2019
Exec Dt:
11/05/2019
Exec Dt:
11/12/2019
Exec Dt:
10/25/2019
Exec Dt:
11/13/2019
Assignee:
ONE TECHNOLOGY DRIVE
SUITE 407
MILPITAS, CALIFORNIA 95035
Correspondent:
SPANO LAW GROUP
851 BURLWAY ROAD
SUITE 407
BURLINGAME, CA 94010

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