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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
02/07/2023
Application #:
17093313
Filing Dt:
11/09/2020
Publication #:
Pub Dt:
02/25/2021
Inventors:
Jesmin Haq, Tom Zhong, Zhongjian Teng
Title:
Critical Dimension (CD) Uniformity of Photoresist Island Patterns Using Alternating Phase Shifting Mask
Assignment: 1
Reel/Frame:
054317/0506Recorded: 11/09/2020Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/07/2018
Exec Dt:
09/07/2018
Exec Dt:
09/07/2018
Assignee:
678 SOUTH HILLVIEW DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
HAYNES AND BOONE, LLP (24061) IP SECTION
2323 VICTORY AVENUE
SUITE 700
DALLAS, TX 75219
Assignment: 2
Reel/Frame:
054317/0564Recorded: 11/09/2020Pages: 20
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
02/04/2019
Assignee:
NO. 8, LI-HSIN RD. 6
HSINCHU SCIENCE PARK
HSINCHU, TAIWAN 300-78
Correspondent:
HAYNES AND BOONE, LLP (24061) IP SECTION
2323 VICTORY AVENUE
SUITE 700
DALLAS, TX 75219

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