Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/07/2023
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Application #:
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17187586
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Filing Dt:
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02/26/2021
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Publication #:
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Pub Dt:
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09/09/2021
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Inventor:
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Eijiro FURUTA
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Title:
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INSPECTION METHOD OF EXAMINATION SYSTEM AND EXAMINATION SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-10, FUKUURA, KANAZAWA-KU |
| YOKOHAMA-SHI |
| KANAGAWA, JAPAN 236-0004 |
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| HOLTZ, HOLTZ & VOLEK PC |
| 630 NINTH AVENUE |
| SUITE 1010 |
| NEW YORK, NY 10036-3744 |
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