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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
02/14/2023
Application #:
17037115
Filing Dt:
09/29/2020
Publication #:
Pub Dt:
04/15/2021
Inventors:
Chun-Ting LIU, Wen-Li WU, Bo-Ching HE, Guo-Dung CHEN, Sheng-Hsun WU, Wei-En FU
Title:
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE
Assignment: 1
Reel/Frame:
053946/0321Recorded: 10/01/2020Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/07/2020
Exec Dt:
09/04/2020
Exec Dt:
09/07/2020
Exec Dt:
09/09/2020
Exec Dt:
09/07/2020
Exec Dt:
09/07/2020
Assignee:
NO. 195, SEC. 4, CHUNG HSING RD., CHUTUNG
HSINCHU, TAIWAN 310401
Correspondent:
BIRCH, STEWART, KOLASCH & BIRCH, LLP
8110 GATEHOUSE ROAD, SUITE 100 E
FALLS CHURCH, VA 22042
Assignment: 2
Reel/Frame:
064004/0310Recorded: 06/21/2023Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/21/2023
Assignee:
BLDG.21, NO.195, SEC.4, CHUNG HSING RD., CHUTUNG,
HSINCHU, TAIWAN
Correspondent:
JCIPRNET
8F-1, NO. 100, ROOSEVELT RD. SEC. 2,
TAIPEI, 100404 TAIWAN

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