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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
03/28/2023
Application #:
17310856
Filing Dt:
08/26/2021
Publication #:
Pub Dt:
03/17/2022
Inventors:
Shigenori NAGANO, Yoshie OTAKE, Satoru ISHIGURO, Hideyuki SUNAGA, Koji IKADO et al
Title:
NONDESTRUCTIVE TESTING SYSTEM AND NONDESTRUCTIVE TESTING METHOD
Assignment: 1
Reel/Frame:
057304/0265Recorded: 08/26/2021Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/29/2021
Exec Dt:
07/29/2021
Exec Dt:
08/05/2021
Exec Dt:
07/29/2021
Assignee:
2-1 HIROSAWA
WAKO-SH, SAITAMA, JAPAN 351-0198
Correspondent:
JEFFREY M. WEINICK
CHIESA SHAHINIAN & GIANTOMASI PC
ONE BOLAND DRIVE
WEST ORANGE, NJ 07052
Assignment: 2
Reel/Frame:
057304/0257Recorded: 08/26/2021Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/05/2021
Exec Dt:
08/05/2021
Assignee:
75-1, HASUNUMA-CHO
ITABASHI-KU, TOKYO, JAPAN 174-8580
Correspondent:
JEFFREY M. WEINICK
CHIESA SHAHINIAN & GIANTOMASI PC
ONE BOLAND DRIVE
WEST ORANGE, NJ 07052

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