Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/28/2023
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Application #:
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17634441
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Filing Dt:
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02/10/2022
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Publication #:
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Pub Dt:
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10/06/2022
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Inventors:
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Yoshifumi Mizuno, Hiroyuki Wada, Satoshi Takaichi
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Title:
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Secondary Battery Short-Circuiting Assessment Device, Short-Circuiting Assessment Method, and Short-Circuiting Assessment System
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2, TAKARA-CHO, KANAGAWA-KU |
| YOKOHAMA-SHI, KANAGAWA, JAPAN 221-0023 |
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| 13-15 QUAI LE GALLO |
| BOULOGNE-BILLANCOURT, FRANCE 92100 |
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| YOUNG BASILE HANLON & MACFARLANE, P.C. |
| 3001 WEST BIG BEAVER RD. |
| SUITE 624 |
| TROY, MI 48084 |
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