Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/16/2023
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Application #:
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17334172
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Filing Dt:
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05/28/2021
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Publication #:
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Pub Dt:
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12/09/2021
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Inventors:
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Ching-Wei WU, Ming-En BU, He-Zhou WAN, Hidehiro FUJIWARA, Xiu-Li YANG
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Title:
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METHOD OF CERTIFYING SAFETY LEVELS OF SEMICONDUCTOR MEMORIES IN INTEGRATED CIRCUITS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK |
| HSINCHU, TAIWAN 300-78 |
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| 4000, WEN XIANG RD., SONGJIANG |
| SHANGHAI, CHINA |
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| HAUPTMAN HAM, LLP (TSMC) |
| 2318 MILL ROAD |
| SUITE 1400 |
| ALEXANDRIA, VA 22314 |
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