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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
08/08/2023
Application #:
17275674
Filing Dt:
03/12/2021
Publication #:
Pub Dt:
02/10/2022
Inventors:
Weiya XIE, Yiming CHEN, Mengjiao ZHANG, Shiying WU, Qian CHENG, Ya GAO, Yingna CHEN et al
Title:
METHOD FOR TESTING LIFETIME OF SURFACE STATE CARRIER OF SEMICONDUCTOR
Assignment: 1
Reel/Frame:
055597/0969Recorded: 03/15/2021Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/08/2021
Exec Dt:
03/08/2021
Exec Dt:
03/08/2021
Exec Dt:
03/08/2021
Exec Dt:
03/08/2021
Exec Dt:
03/08/2021
Exec Dt:
03/08/2021
Exec Dt:
03/08/2021
Assignee:
NO.1239 SIPING ROAD, YANGPU DISTRICT
SHANGHAI, CHINA 200092
Correspondent:
JCIP GLOBAL INC.
20 PACIFICA, SUITE 220
IRVINE, CA 92618

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