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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
11740560
Issue Dt:
08/29/2023
Application #:
17910454
Filing Dt:
09/09/2022
Publication #:
20230058166
Pub Dt:
02/23/2023
Inventors:
Eleftherios KOULIERAKIS, Carlo LANCIA, Juan Manuel GONZALEZ HUESCA, Alexander YPMA et al
Title:
METHOD FOR DETERMINING AN INSPECTION STRATEGY FOR A GROUP OF SUBSTRATES IN A SEMICONDUCTOR MANUFACTURING PROCESS
Assignment: 1
Reel/Frame:
061049/0587Recorded: 09/09/2022Pages: 9
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
KOULIERAKIS, ELEFTHERIOS
Exec Dt:
10/13/2020
LANCIA, CARLO
Exec Dt:
12/11/2020
GONZALEZ HUESCA, JUAN MANUEL
Exec Dt:
10/09/2020
YPMA, ALEXANDER
Exec Dt:
10/14/2020
GKOROU, DIMITRA
Exec Dt:
10/13/2020
SAHRAEIAN, REZA
Exec Dt:
10/13/2020
Assignee:
ASML NETHERLANDS B.V.
P.O. BOX 324
VELDHOVEN, NETHERLANDS 5500 AH
Correspondent:
PILLSBURY WINTHROP SHAW PITTMAN, LLP
PO BOX 10500
MCLEAN, VA 22102

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