Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/19/2023
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Application #:
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17576016
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Filing Dt:
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01/14/2022
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Publication #:
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Pub Dt:
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07/21/2022
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Inventors:
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Shigeyuki Morishita, Ryusuke Sagawa, Fuminori Uematsu, Tomohiro Nakamichi, Keito Aibara
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Title:
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Method of Measuring Aberration and Electron Microscope
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-1-2 MUSASHINO, AKISHIMA |
| TOKYO, JAPAN 196-8558 |
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| THE WEBB LAW FIRM, P.C. |
| ONE GATEWAY CENTER |
| 420 FT. DUQUESNE BLVD., SUITE 1200 |
| PITTSBURGH, 15222 UNITED STATES |
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