Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/17/2023
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Application #:
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17285537
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Filing Dt:
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04/15/2021
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Publication #:
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Pub Dt:
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12/09/2021
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Inventors:
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Nobuaki HIROSE, Takashi HIROI, Takahiro URANO
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Title:
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Defect Inspection Device and Defect Inspection Method
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 17-1, TORANOMON 1-CHOME |
| MINATO-KU, TOKYO, JAPAN |
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| CROWELL & MORING LLP |
| P.O. BOX 14300 |
| WASHINGTON, DC 20044-4300 |
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