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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
12/05/2023
Application #:
17911050
Filing Dt:
09/12/2022
Publication #:
Pub Dt:
04/06/2023
Inventors:
Kazunori MIYAZAWA, Shoma TAKEDA, Shinya MITO, Fumitake TERAO, Shoichi SHIOSAKI
Title:
MAGNETIC FLAW DETECTION METHOD, MAGNETIC FIELD MEASUREMENT PROCESSING APPARATUS, AND MAGNETIC FLAW DETECTION APPARATUS
Assignment: 1
Reel/Frame:
061251/0920Recorded: 09/29/2022Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/29/2022
Exec Dt:
08/29/2022
Exec Dt:
08/29/2022
Exec Dt:
08/29/2022
Exec Dt:
08/29/2022
Assignee:
9-32, NAKACHO 2-CHOME, MUSASHINO-SHI
TOKYO, JAPAN 1808750
Correspondent:
RANKIN, HILL & CLARK LLP
38210 GLENN AVENUE
WILLOUGHBY, OH 44094

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