Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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01/16/2024
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Application #:
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17114842
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Filing Dt:
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12/08/2020
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Publication #:
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Pub Dt:
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06/03/2021
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Inventors:
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Heath POIS, David REED, Bruno SHUELER, Rodney SMEDT, Jeffrey FANTON
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Title:
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SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATTEROMETRY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3090 OAKMEAD VILLAGE DRIVE |
| SANTA CLARA, CALIFORNIA 95051 |
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| RECHES PATENT |
| 211 NORTH UNION STREET, SUITE 100 |
| ALEXANDRIA, VA 22314 |
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Assignment:
2
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MERGER (SEE DOCUMENT FOR DETAILS).
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| 3342 GATEWAY BLVD |
| FREEMONT, CALIFORNIA 94538 |
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| RECHES PATENT |
| 211 NORTH UNION STREET, SUITE 100 |
| ALEXANDRIA, VA 22314 |
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Assignment:
3
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| DAVID FIKES ST 5 |
| REHOVOT, ISRAEL 7632805 |
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| RECHES PATENT |
| 211 NORTH UNION STREET, SUITE 100 |
| ALEXANDRIA, VA 22314 |
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Assignment:
4
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CORRECTIVE ASSIGNMENT TO CORRECT THE NAME CHANGE ON THE COVER SHEET TO NOVA LTD. PREVIOUSLY RECORDED AT REEL: 058752 FRAME: 0343. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
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| DAVID FIKES ST 5, P.O. BOX 1630 |
| REHOVOT, ISRAEL 7632805 |
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| RECHES PATENT |
| 211 NORTH UNION STREET, SUITE 100 |
| ALEXANDRIA, VA 22314 |
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05/29/2024 10:46 PM
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