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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
05/14/2024
Application #:
16598457
Filing Dt:
10/10/2019
Publication #:
Pub Dt:
04/16/2020
Inventors:
BABAK PARKHIDEH, ANDREAS LAUER
Title:
SYSTEMS AND METHODS TO DETECT AND MEASURE THE CURRENT MISMATCH AMONG PARALLEL SEMICONDUCTOR DEVICES
Assignment: 1
Reel/Frame:
050832/0564Recorded: 10/25/2019Pages: 2
Conveyance:
CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
10/22/2019
Assignee:
2415 EISENHOWER AVENUE
ROOM W 18000
ALEXANDRIA, VIRGINIA 22314
Correspondent:
NATIONAL SCIENCE FOUNDATION
2415 EISENHOWER AVENUE
ROOM W 18000
ALEXANDRIA, VA 22314
Assignment: 2
Reel/Frame:
051013/0377Recorded: 11/14/2019Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/04/2019
Exec Dt:
11/04/2019
Assignee:
OFFICE OF TECHNOLOGY TRANSFER
228 PORTAL, 9201 UNIVERSITY CITY BLVD
CHARLOTTE, NORTH CAROLINA 28223-0001
Correspondent:
CHARLES W. GRIGGERS
3200 WINDY HILL ROAD
SUITE 1600E
ATLANTA, GA 30339

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