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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
06/22/1982
Application #:
06163295
Filing Dt:
06/26/1980
Inventors:
TSUNEO OKUBO, YASUO KATO, GENYA MATSUOKA
Title:
METHOD AND SYSTEM FOR MEASURING THE DIAMETER OF AN ELECTRON BEAM
Assignment: 1
Reel/Frame:
003942/0098Recorded: 01/07/1982Pages: 1
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
Exec Dt:
06/13/1980
Exec Dt:
06/13/1980
Exec Dt:
06/13/1980
Assignees:
1-6, 1-CHOME, UCHISAIWAICHO
CHIYODA-KU
TOKYO, JAPAN
5-1, MARUNOUCHI 1-CHOME
CHIYODA-KU
TOKYO, JAPAN
Correspondent:
CRAIG & ANTONELLI
STE. 600, 1919 PA. AVE., N. W.
WASHINGTON, DC 20006
Assignment: 2
Reel/Frame:
004454/0001Recorded: 07/30/1985Pages: 75
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). EFFECTIVE ON 07/12/1985
Assignor:
Exec Dt:
07/18/1985
Assignee:
Correspondent:
JOHN C. SMITH, JR.
2001 JEFF. DAVIS HWY., STE. 501
ARLINGTON, VA. 22202

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