Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
Total Assignments:
1
|
Patent #:
|
|
Issue Dt:
|
02/07/1984
|
Application #:
|
06502461
|
Filing Dt:
|
06/09/1983
|
Inventor:
|
TSUTOMU TSUKADA
|
Title:
|
METHOD OF MONITORING STATUS OF A SILICON LAYER BY DETECTING, EMISSION SPECTRA VARIABLE DURING ETCHING
|
|
Assignment:
1
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST.
|
|
|
|
|
|
8-1, YOTSUYA 5-CHOME, FUCHU-SHI |
TOKYO, JAPAN 183 |
|
|
|
LAFF, WHITESEL, CONTE & SARET |
JOHN HANCOCK CENTER |
CHICAGO, IL 60611 |
|
|
Search Results as of:
04/29/2024 11:05 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|