Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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06/11/1985
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Application #:
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06266054
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Filing Dt:
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05/21/1981
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Inventors:
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MASAO OKUBO, YASURO YOSHIMITSU
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Title:
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COMPLEX PROBE CARD FOR TESTING A SEMICONDUCTOR WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| WENDEROTH, LIND & PONACK |
| 1750 PA. AVE., N. W., STE. 1100 |
| WASHINGTON, DC 20006 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| WENDEROTH, LIND & PONACK |
| 1750 PA. AVE., N. W., STE. 1100 |
| WASHINGTON, DC 20006 |
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