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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
12/02/1986
Application #:
06751299
Filing Dt:
07/02/1985
Inventors:
YUSUKE TSUKAHARA, EIJI TAKEUCHI, EISAKU HAYASHI
Title:
METHOD OF LAYER THICKNESS MEASUREMENT
Assignment: 1
Reel/Frame:
004429/0118Recorded: 07/02/1985Pages: 1
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
Exec Dt:
06/24/1985
Exec Dt:
06/24/1985
Exec Dt:
06/24/1985
Assignee:
5-1, 1-CHOME, TAITO-KU
A CORP.OF JAPAN
TOKYO, JAPAN
Correspondent:
BACON & THOMAS
1755 JEFF., DAVIS HWY.
STE., 300
ARLINGTON, VA 22202

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