Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/03/1987
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Application #:
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06648911
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Filing Dt:
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09/10/1984
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Inventor:
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KENICHI KOBAYASHI
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Title:
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INSPECTION METHOD AND APPARATUS FOR A MASK PATTERN USED IN SEMICONDUCTOR DEVICE FABRICATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 1015, KAMIKODANAKA, NAKAHARA-KU, |
| KAWASAKI-SHI, |
| KANAGAWA, JAPAN 211 |
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| ARMSTRONG, NIKAIDO, MARMELSTEIN & |
| KUBOVCIK |
| 1725 K ST., N. W., STE. 912 |
| WASHINGTON, DC 20006 |
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