Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/17/1988
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Application #:
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06858613
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Filing Dt:
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05/01/1986
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Inventors:
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JAN D. REIMER, VICTOR R. AKYLAS
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Title:
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ELECTRON-BEAM PROBE SYSTEM UTILIZING TEST DEVICE HAVING INTERDIGITATED CONDUCTIVE PATTERN AND ASSOCIATED METHOD OF USING THE TEST DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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811 E. ARQUES |
A CORP. OF CA |
SUNNYVALE, CALIFORNIA 94088-3409 |
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RONALD J. MEETIN |
SIGNETICS CORP., |
PATENT DEPT., - M/S 54 |
811 E. ARQUES |
SUNNYVALE, CA 94088-3409 |
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