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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/24/1988
Application #:
06903021
Filing Dt:
09/02/1986
Inventors:
TAKAMASA SAKAI, MOTOHIRO KONO, TAKAYUKI UMABA, YOSHIYUKI NAKAGAWA, YOSHIHIRO KOYAMA
Title:
PROBING APPARATUS FOR MEASURING ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR DEVICE FORMED ON WAFER
Assignment: 1
Reel/Frame:
004846/0544Recorded: 03/24/1988Pages: 1
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
Exec Dt:
02/24/1988
Exec Dt:
02/24/1988
Exec Dt:
02/24/1988
Exec Dt:
02/24/1988
Exec Dt:
02/24/1988
Assignee:
1-1 TENJINKITAMACHI, TERANOUCHI-AGARU
4-CHOME, HORIKAWA-DORI, KAMIKYO-KU, KYOTO-SHI
KYOTO-FU, JAPAN
Correspondent:
ANTHONY G. M. DAVIS, ESQ.
HAYES, DAVIS & SOLOWAY
175 CANAL STREET
MANCHESTER, NH 03101

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