Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/26/1988
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Application #:
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07003572
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Filing Dt:
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01/15/1987
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Inventors:
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AKIHIRO YOSHIDA, TAKAHIDE IIDA, HIROSHI MIYAKE, SHUZO HATTORI
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Title:
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METHOD AND DEVICE FOR DETECTING DEFECTS OF PATTERNS IN MICROELECTRONIC DEVICES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 1, TOYODA-CHO 2-CHOME, KARIYA-SHI, |
| AICHI-KEN, JAPAN |
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| 42-1, MUSASHIZUKA, NAGAKUTE, NAGAKUTE-CHO, |
| AICHI-KEN, JAPAN |
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| BROOKS HAIDT HAFFNER & DELAHUNTY |
| 99 PARK AVE. |
| NEW YORK, NY 10016 |
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