Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/14/1989
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Application #:
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06885197
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Filing Dt:
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07/14/1986
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Inventors:
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DONALD F. SPECHT, TIM S. WIHL, SCOTT A. YOUNG, JAMES J. HAGER JR., MATTHEW B. LUTZKER
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Title:
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AUTOMATIC PHOTOMASK AND RETICLE INSPECTION METHOD AND APPARATUS INCLUDING IMPROVED DEFECT DETECTOR AND ALIGNMENT SUB-SYSTEMS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 2051 MISSION COLLEGE BLVD. |
| SANTA CLARA, CALIFORNIA 95054 |
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| HAMRICK, HOFFMAN, GUILLOT & KAZUBOWSKI |
| 777 NORTH FIRST ST., STE. 444 |
| SAN JOSE, CA 95112 |
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