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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/11/1989
Application #:
06941626
Filing Dt:
12/11/1986
Inventors:
JOJI KATSURA, SEIJI YAMAGUCHI, KAZUHIKO TSUJI, EISUKE ICHINOHE
Title:
METHOD FOR MEASURING A CHARACTERISTIC OF SEMICONDUCTOR MEMORY DEVICE
Assignment: 1
Reel/Frame:
004648/0350Recorded: 12/11/1986Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
Exec Dt:
12/04/1986
Exec Dt:
12/04/1986
Exec Dt:
12/04/1986
Exec Dt:
12/04/1986
Assignee:
1006 OAZA KADOMA
KADOMA, OSAKA 571, JAPAN
Correspondent:
WENDEROTH, LIND AND PONACK
1750 PA. AVENUE, N.W., STE. 1100
WASHINGTON, DC 20006

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