Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/18/1989
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Application #:
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07042424
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Filing Dt:
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04/24/1987
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Inventor:
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YASUHIRO FUKUDA
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Title:
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METHOD OF AND APPARATUS FOR TESTING SEMICONDUCTOR DEVICE FOR ELECTROSTATIC DISCHARGE DAMAGE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 7-12, TORANOMON 1-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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| WENDEROTH, LIND & PONACK |
| 1750 PENN AVENUE, N.W. |
| STE. 1100 |
| WASHINGTON, DC 20006 |
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