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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/27/1990
Application #:
07248137
Filing Dt:
09/23/1988
Inventors:
MOTOSUKE MIYOSHI, KATSUYA OKUMURA
Title:
METHOD OF TESTING SEMICONDUCTOR ELEMENTS
Assignment: 1
Reel/Frame:
004953/0751Recorded: 09/23/1988Pages: 1
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
Exec Dt:
09/13/1988
Exec Dt:
09/15/1988
Assignee:
JAPAN
Correspondent:
SCHWARTZ, JEFFERY, SCHWAAB, MACK,
BLUMENTHAL & EVENS
P.0. BOX 299
ALEXANDRIA, VA 22313-0299

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