Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/14/1991
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Application #:
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07506734
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Filing Dt:
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04/10/1990
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Inventors:
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TERRY R. GUILINGER, HOWLAND D. T. JONES, MICHAEL J. KELLY, JOHN W. MEDERNACH et al
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Title:
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ELECTROCHEMICAL METHOD FOR DEFECT DELINEATION IN SILICON-ON-INSULATOR WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST. SUBJECT TO A LICENSE RECITED. THIS DOCUMENT IS ALSO SIGNED BY THE CONTRACTOR SANDIA CORPORATION.
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| RICHARD E. CONSTANT |
| ASSISTANT GENERAL COUNSEL FOR PATENTS |
| U.S. DOE, GC-42 (FORSTL) MS-6F-067 |
| 1000 INDEPENDENCE AVE. S.W. |
| WASHINGTON, DC 20585 |
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