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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
12/03/1991
Application #:
07532481
Filing Dt:
06/04/1990
Inventors:
OH-KYONG KWON, MASASHI HASHIMOTO, SATWINDER MALHI, ENG C. BORN
Title:
FULL WAFER INTEGRATED CIRCUIT TESTING DEVICE
Assignment: 1
Reel/Frame:
005332/0265Recorded: 06/04/1990Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
Exec Dt:
06/01/1990
Exec Dt:
06/01/1990
Exec Dt:
06/01/1990
Exec Dt:
06/01/1990
Assignee:
13500 NORTH CENTRAL EXPRESSWAY
DALLAT, TEXAS 75265
Correspondent:
DOUGLAS A. SORENSEN
TEXAS INSTRUMENTS INCORPORATED
P.O. BOX 655474, M/S 219
DALLAS, TX 75265

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