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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
12/17/1991
Application #:
07256991
Filing Dt:
10/13/1988
Inventor:
TAMI ISOBE
Title:
METHOD FOR MEASURING REFRACTIVE INDEX OF THIN FILM LAYER
Assignment: 1
Reel/Frame:
005732/0836Recorded: 06/14/1991Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignor:
Exec Dt:
11/15/1988
Assignee:
A JOINT-STOCK COMPANY OF JAPAN
3-6, 1-CHOME, NAKAMAGOME, OTA-KU
TOKYO, JAPAN
Correspondent:
OBLON, FISHER, SPIVAK, MCCLELLAND &
MAIER
CRYSTAL SQUARE FIVE-SUITE 400
1755 S. JEFFERSON DAVIS HWY.
ARLINGTON, VA 22202

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