Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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01/14/1992
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Application #:
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07475768
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Filing Dt:
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02/05/1990
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Inventors:
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TATEO KUSAMA, KUNIO IBA
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Title:
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METHOD FOR MEASURING LIFETIME OF SEMICONDUCTOR MATERIAL AND APPARATUS THEREFOR
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 508-2, OCHIAI, TAMA-SHI |
| TOKYO, JAPAN |
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| WENDEROTH, LIND & PONACK |
| SOUTHERN BUILDING - STE. 700 |
| 805 FIFTEENTH STREET, N.W. |
| WASHINGTON, DC 20005 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 28, AZA-JONO, KITAIMA, BISAI-SHI |
| AICHI-KEN, JAPAN |
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| ADAM C. VOLENTINE |
| WENDEROTH, LIND & PONACK |
| 805 15TH STREET, N.W. |
| SUITE 700 |
| WASHINGTON, DC 20005 |
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