Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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02/18/1992
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Application #:
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07491089
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Filing Dt:
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03/09/1990
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Inventors:
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KENZO HATADA, TAKESHI ISHIHARA, NOBUAKI SUZUKI, SATOWAKA KURODA
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Title:
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DEVICE FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUITS AND METHOD OF TESTING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 1006 OAZA KADOMA, KADOMA-SHI |
| A CORP. OF JAPAN |
| OSAKA, JAPAN |
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| SIXBEY, FRIEDMAN, LEEDOM, ET AL |
| ONE SKYLINE PLACE |
| 5205 LEESBURG PIKE, SUITE 310 |
| FALLS CHURCH, VA 22041 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 2-24-5 AOMATANI HIGASHI MINO CITY 562 JAPAN |
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| SIXBEY, FRIEDMAN, LEEDOM & FERGUSON |
| 2010 CORPORATE RIDGE, STE. 600 |
| MC LEAN, VA 22102 |
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