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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
03/17/1992
Application #:
07453902
Filing Dt:
12/20/1989
Inventor:
TAMI ISOBE
Title:
METHOD FOR MEASURING REFRACTIVE INDEX OF THIN FILM LAYER
Assignment: 1
Reel/Frame:
005941/0268Recorded: 12/13/1991Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignor:
Exec Dt:
12/28/1989
Assignee:
3-6, 1-CHOME NAKAMAGOME, OTA-KU
TOKYO, JAPAN
Correspondent:
ROBERT F. GNUSE
OBLON, SPIVAK, MCCLELLAND,
MAIER & NEUSTADT
1755 JEFF. DAVIS HWY, 4TH FL.
ARLINGTON, VA 22202
Assignment: 2
Reel/Frame:
007980/0087Recorded: 03/07/1996Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
01/08/1996
Assignee:
LAKEVIEW & CLARKE AVENUES
MILFORD, DELAWARE 19963
Correspondent:
DENTSPLY INTERNATIONAL INC.
JAMES B. HIEBER, ESQUIRE
570 WEST COLLEGE AVENUE
YORK, PA 17404

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