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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/07/1992
Application #:
07503005
Filing Dt:
04/02/1990
Inventor:
MEHRDAD M. MOSLEHI
Title:
ELECTROMAGNETIC WAVE MEASUREMENT OF CONDUCTIVE LAYERS OF A SEMICONDUCT SEMICONDUCTOR WAFER DURING PROCESSING IN A FABRICATION CHAMBER
Assignment: 1
Reel/Frame:
005265/0999Recorded: 04/02/1990Pages: 1
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignor:
Exec Dt:
03/31/1990
Assignee:
Correspondent:
DOUGLAS A. SORENSEN
TEXAS INSTRUMENTS INCORPORATED
P.O. BOX 655474
M/S 219
DALLAS, TX 75265

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