Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/14/1992
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Application #:
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07641195
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Filing Dt:
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01/14/1991
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Inventors:
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KAZUHIRO SAKASHITA, TAKESHI HASHIZUME
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Title:
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SCAN TEST CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 2-3 MARUNOUCHI 2-CHOME, CHIYODA-KU, |
| TOKYO,, JAPAN |
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| LOWE, PRICE, LEBLANC, BECKER & SHUR |
| 99 CANAL CENTER PLAZA |
| SUITE 300 |
| ALEXANDRIA, VA 22314 |
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