Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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01/18/1994
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Application #:
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07723170
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Filing Dt:
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06/28/1991
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Inventor:
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DANIEL A. CORLISS
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Title:
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STRUCTURE AND METHOD FOR DIRECT CALIBRATION OF REGISTRATION MEASUREMENT SYSTEMS TO ACTUAL SEMICONDUCTOR WAFER PROCESS TOPOGRAPHY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 77 REED ROAD |
| HUDSON, MASSACHUSETTS 01749 |
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| MICHAEL G. FLETCHER |
| ARNOLD, WHITE & DURKEE |
| P.O. BOX 4433 |
| HOUSTON, TX 77210 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 20555 STATE HIGHWAY 249 |
| HOUSTON, TEXAS 77070 |
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| CONLEY, ROSE & TAYON, P.C. |
| JONATHAN M. HARRIS |
| P.O. BOX 3267 |
| HOUSTON, TEXAS 77253-3267 |
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