Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/15/1994
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Application #:
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07970292
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Filing Dt:
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11/02/1992
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Inventors:
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SUSAN M. KEOWN, MYRON J. MISKE
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Title:
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INDIVIDUALIZED PREPACKAGE AC PERFORMANCE TESTING OF IC DIES ON A WAFER USING DC PARAMETRIC TEST PATTERNS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 2900 SEMICONDUCTOR DRIVE |
| SANTA CLARA, CALIFORNIA 95052-8090 |
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| DANIEL H. KANE |
| FENTON, CHAPMAN, FENTON, ET AL. |
| 109 MAIN ST., P.O. BOX B |
| BAR HARBOR, ME 04609 |
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