Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/29/1994
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Application #:
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07813511
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Filing Dt:
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12/26/1991
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Inventor:
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TOHRU FURUYAMA
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Title:
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METHOD FOR TESTING SEMICONDUCTOR DEVICES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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72 HORIKAWA-CHO, SAIWAI-KU |
A CORPORATION OF JAPAN |
KAWASAKI-SHI, JAPAN |
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BANNER, BIRCH, MCKIE & BECKETT |
1001 G. ST., NW 11TH FL. |
WASHINGTON, DC 20001-4597 |
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