Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/19/1994
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Application #:
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07901160
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Filing Dt:
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06/19/1992
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Inventors:
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OTTO ALBRECHT, KEN EGUCHI
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Title:
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A NONDESTRUCTIVE METHOD FOR DETECTING DEFECTS IN THIN FILM USING SCATTERED LIGHT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 30-2, 3-CHOME, SHIMOMARUKO |
| OHTA-KU, TOKYO, JAPAN |
| JAPAN |
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| FITZPATRICK CELLA HARPER & SCINTO |
| PENINA WOLLMAN |
| 277 PARK AVENUE |
| NEW YORK, NY 10172-0194 |
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