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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
06/14/1994
Application #:
07842121
Filing Dt:
05/18/1992
Inventors:
YOSHIMASA OOSHIMA, TOSHIO SHIMIZU, KATSUYA IIDA, FUMIAKI KUMAZAWA
Title:
METHOD FOR INSPECTING SEMICONDUCTOR DEVICES
Assignment: 1
Reel/Frame:
006127/0239Recorded: 05/22/1992Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
Exec Dt:
05/06/1992
Exec Dt:
05/06/1992
Exec Dt:
05/06/1992
Exec Dt:
05/06/1992
Assignee:
4-1, NISHISHINJUKU 2-CHOME
SHINJUKU-KU, TOKYO-TO, JAPAN
Correspondent:
GREGORY D. OGROD
S-MOS SYSTEMS
2460 NORTH FIRST STREET
SAN JOSE, CA 95131-1002

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