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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
09/27/1994
Application #:
07869241
Filing Dt:
04/15/1992
Inventors:
HIROICHI ISHIKAWA, MICHAEL S. KOLESA
Title:
SEMICONDUCTOR WAFER TEMPERATURE DETERMINATION BY OPTICAL MEASUREMENT OF WAFER EXPANSION IN PROCESSING APPARATUS CHAMBER
Assignment: 1
Reel/Frame:
006178/0133Recorded: 07/06/1992Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignor:
Exec Dt:
04/13/1992
Assignee:
ROUTE 303 NORTH
ORAGNEBURG, NEW YORK 10962
Correspondent:
WOOD, HERRON & EVANS
JOSEPH R. JORDAN
2700 CAREW TOWER
CINCINNATI, OH 45202
Assignment: 2
Reel/Frame:
006178/0136Recorded: 07/06/1992Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignor:
Exec Dt:
04/14/1992
Assignee:
ROUTE 303 NORTH
ORANGEBURG, NEW YORK 10962
Correspondent:
WOOD, HERRON & EVANS
JOSEPH R. JORDAN
2700 CAREW TOWER
CINCINNATI, OHIO 45202
Assignment: 3
Reel/Frame:
009306/0971Recorded: 07/16/1998Pages: 24
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/24/1998
Exec Dt:
06/24/1998
Assignee:
TBS BROADCASTING CENTER, 3-6 AKASAKA 5-CHOME
MINATO-KU, TOKYO 107, JAPAN
Correspondent:
WOOD, HERRON & EVANS, L.L.P.
JOSEPH R. JORDAN, ESQ.
2700 CAREW TOWER
CINCINNATI, OH 45202

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